TY - JOUR
T1 - Preferential etching of Si(111) and Si(001) in dilute NH4F solutions
T2 - Proceedings of the 1995 MRS Spring Meeting
AU - Itaya, Kingo
AU - Yau, Shueh Lin
AU - Kaji, Kazutoshi
PY - 1995
Y1 - 1995
N2 - In situ scanning tunneling microscopy (STM) was used to examine the etching process of n-Si(111) and Si(001) electrodes in dilute NH4F under cathodic potential control. For Si(111), time-dependent STM images have revealed the pronounced effect of the microscopic structure of surface Si atoms on their dissolution rates. The multiple hydrogen bonded Si atoms at the kink sites and dihydride steps eroded faster than the monohydride terminated Si. Presumably, the higher polarity at these defect sites is responsible for the difference. Steric consideration further favors the higher activity at the more open kink sites. The monohydride terminated Si(111) surface represents the most stable surface structure, which guides the dissolution of the Si(001) surface to the formation of {111} facets. The initial stage {111} facet formation on a Si(001) surface was revealed by in situ STM.
AB - In situ scanning tunneling microscopy (STM) was used to examine the etching process of n-Si(111) and Si(001) electrodes in dilute NH4F under cathodic potential control. For Si(111), time-dependent STM images have revealed the pronounced effect of the microscopic structure of surface Si atoms on their dissolution rates. The multiple hydrogen bonded Si atoms at the kink sites and dihydride steps eroded faster than the monohydride terminated Si. Presumably, the higher polarity at these defect sites is responsible for the difference. Steric consideration further favors the higher activity at the more open kink sites. The monohydride terminated Si(111) surface represents the most stable surface structure, which guides the dissolution of the Si(001) surface to the formation of {111} facets. The initial stage {111} facet formation on a Si(001) surface was revealed by in situ STM.
UR - http://www.scopus.com/inward/record.url?scp=0029477344&partnerID=8YFLogxK
U2 - 10.1557/proc-386-365
DO - 10.1557/proc-386-365
M3 - 會議論文
AN - SCOPUS:0029477344
SN - 0272-9172
VL - 386
SP - 365
EP - 370
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
Y2 - 17 April 1995 through 21 April 1995
ER -