Precise determination of absolute coverage of thin films by layer-resolved surface states

Cheng Maw Cheng; Ku Ding Tsuei; Chi Ting Tsai; Dah An Luh

doi:10.1063/1.2916820

Precise determination of absolute coverage of thin films by layer-resolved surface states

Cheng Maw Cheng, Ku Ding Tsuei, Chi Ting Tsai, Dah An Luh

物理學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

7 引文斯高帕斯（Scopus）

摘要

We report a technique to determine the coverage of metallic thin films by analyzing layer-resolved surface states with photoemission by using atomically flat AgAu (111) thin films as a test system. We analyzed the surface state on Au(111) covered with Ag up to 4 ML with atomic resolution, and precisely determined the total Ag coverage of AgAu (111) through a line-shape analysis. With precise measurements of the absolute coverage of thin films becoming possible, one can calibrate the tooling factor of evaporators with unprecedented accuracy.

原文	???core.languages.en_GB???
文章編號	163102
期刊	Applied Physics Letters
卷	92
發行號	16
DOIs	https://doi.org/10.1063/1.2916820
出版狀態	已出版 - 2008

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10.1063/1.2916820

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abstract = "We report a technique to determine the coverage of metallic thin films by analyzing layer-resolved surface states with photoemission by using atomically flat AgAu (111) thin films as a test system. We analyzed the surface state on Au(111) covered with Ag up to 4 ML with atomic resolution, and precisely determined the total Ag coverage of AgAu (111) through a line-shape analysis. With precise measurements of the absolute coverage of thin films becoming possible, one can calibrate the tooling factor of evaporators with unprecedented accuracy.",

author = "Cheng, {Cheng Maw} and Tsuei, {Ku Ding} and Tsai, {Chi Ting} and Luh, {Dah An}",

note = "Funding Information: National Science Council, Taiwan (Grant No. NSC95-2745-M-008-010) and National Synchrotron Radiation Research Center, Taiwan supported this work.",

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AU - Cheng, Cheng Maw

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AU - Luh, Dah An

N1 - Funding Information: National Science Council, Taiwan (Grant No. NSC95-2745-M-008-010) and National Synchrotron Radiation Research Center, Taiwan supported this work.

PY - 2008

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N2 - We report a technique to determine the coverage of metallic thin films by analyzing layer-resolved surface states with photoemission by using atomically flat AgAu (111) thin films as a test system. We analyzed the surface state on Au(111) covered with Ag up to 4 ML with atomic resolution, and precisely determined the total Ag coverage of AgAu (111) through a line-shape analysis. With precise measurements of the absolute coverage of thin films becoming possible, one can calibrate the tooling factor of evaporators with unprecedented accuracy.

AB - We report a technique to determine the coverage of metallic thin films by analyzing layer-resolved surface states with photoemission by using atomically flat AgAu (111) thin films as a test system. We analyzed the surface state on Au(111) covered with Ag up to 4 ML with atomic resolution, and precisely determined the total Ag coverage of AgAu (111) through a line-shape analysis. With precise measurements of the absolute coverage of thin films becoming possible, one can calibrate the tooling factor of evaporators with unprecedented accuracy.

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Precise determination of absolute coverage of thin films by layer-resolved surface states

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