Permittivity measurement technique for a dielectric strip using a rectangular waveguide

研究成果: 雜誌貢獻會議論文同行評審

2 引文 斯高帕斯(Scopus)

摘要

A measurement technique for a dielectric strip using a rectangular waveguide was developed for the complex permittivity retrieval. A forward scattering solution for the tilted strip in a rectangular waveguide was also constructed using the finite element method. It was found that the sample was unable to fill the whole waveguide cross section.

原文???core.languages.en_GB???
頁(從 - 到)314-317
頁數4
期刊IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
3
出版狀態已出版 - 2001
事件2001 IEEE Antennas and Propagation Society International Symposium -FDTD and Multi-Resolution Methods- - Boston, MA, United States
持續時間: 8 7月 200113 7月 2001

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