摘要
In this study, a standard 650 V enhancement-mode (E-mode) AlGaN/GaN HEMT integrated with a current limiting diode (CLD) on a Si substrate is proposed, forming a new configuration (CLD-HEMT) that does not require extra process steps or costs. A CLD is designed from a 650 V AlGaN/GaN HEMT by shorting the gate and source. The proposed CLD-HEMT demonstrates improved gate capability with an increased input gate voltage swing (>11 V) and enhanced gate reliability in a scenario where a conventional p-GaN gate HEMT would be challenged. Furthermore, the breakdown voltage and reverse conduction are improved in the CLD-HEMT.
| 原文 | ???core.languages.en_GB??? |
|---|---|
| 文章編號 | 085003 |
| 期刊 | ECS Journal of Solid State Science and Technology |
| 卷 | 12 |
| 發行號 | 8 |
| DOIs | |
| 出版狀態 | 已出版 - 8月 2023 |
指紋
深入研究「Performance of an E-mode AlGaN/GaN High-Electron-Mobility Transistor Integrated with a Current Limiting Diode」主題。共同形成了獨特的指紋。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver