Overview of 2022 CAD contest at ICCAD

Yu Guang Chen, Chun Yao Wang, Tsung Wei Huang, Takashi Sato

研究成果: 書貢獻/報告類型會議論文篇章同行評審

2 引文 斯高帕斯(Scopus)

摘要

The "CAD Contest at ICCAD"is a challenging, multi-month, research and development competition, focusing on advanced, realworld problems in the field of electronic design automation (EDA). Since 2012, the contest has been publishing many sophisticated circuit design problems, from system-level design to physical design, together with industrial benchmarks and solution evaluators. Contestants can participate in one or more problems provided by EDA/IC industry. The winners will be awarded at an ICCAD special session dedicated to this contest. Every year, the contest attracts more than a hundred teams, fosters productive industryacademia collaborations, and leads to hundreds of publications in top-tier conferences and journals. The 2022 CAD Contest has 166 teams from all over the world. Moreover, the problems of this year cover state-of-the-art EDA research trends such as circuit security, 3D-IC, and design space exploration from well-known EDA/IC companies. We believe the contest keeps enhancing impact and boosting EDA researches.

原文???core.languages.en_GB???
主出版物標題Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2022
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781450392174
DOIs
出版狀態已出版 - 30 10月 2022
事件41st IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2022 - San Diego, United States
持續時間: 30 10月 20224 11月 2022

出版系列

名字IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN(列印)1092-3152

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???event.eventtypes.event.conference???41st IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2022
國家/地區United States
城市San Diego
期間30/10/224/11/22

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