Overview of 2021 CAD Contest at ICCAD

Tsung Wei Huang, Yu Guang Chen, Chun Yao Wang, Takashi Sato

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

The “CAD Contest at ICCAD” is a challenging, multi-month, research and development competition, focusing on advanced, real-world problems in the field of electronic design automation (EDA). Since 2012, the contest has been publishing many sophisticated circuit design problems, from system-level design to physical design, together with industrial benchmarks and solution evaluators. Contestants can participate in one or more problems provided by EDA/IC industry. The winners will be awarded at an ICCAD special session dedicated to this contest. Every year, the contest attracts more than a hundred teams, fosters productive industry-academia collaborations, and leads to hundreds of publications in top-tier conferences and journals. The 2021 CAD Contest has 137 teams from all over the world. The contest keeps enhancing impact and boosting EDA research.

原文???core.languages.en_GB???
主出版物標題2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781665445078
DOIs
出版狀態已出版 - 2021
事件40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Munich, Germany
持續時間: 1 11月 20214 11月 2021

出版系列

名字IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
2021-November
ISSN(列印)1092-3152

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???event.eventtypes.event.conference???40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021
國家/地區Germany
城市Munich
期間1/11/214/11/21

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