Oscillation ring based interconnect test scheme for SOC

Katherine Shu Min Li; Chung Len Lee; Chauchin Su; Jwu E. Chen

doi:10.1145/1120725.1120800

Oscillation ring based interconnect test scheme for SOC

Katherine Shu Min Li, Chung Len Lee, Chauchin Su, Jwu E. Chen

電機工程學系

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

25 引文斯高帕斯（Scopus）

摘要

We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of,the algorithm. Our method achieves 100% fault coverage with a small number of tests.

原文	???core.languages.en_GB???
主出版物標題	Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
發行者	Institute of Electrical and Electronics Engineers Inc.
頁面	184-187
頁數	4
ISBN（列印）	0780387368, 9780780387362
DOIs	https://doi.org/10.1145/1120725.1120800
出版狀態	已出版 - 2005
事件	2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 - Shanghai, China 持續時間: 18 1月 2005 → 21 1月 2005

出版系列

名字	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
卷	1

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
國家/地區	China
城市	Shanghai
期間	18/01/05 → 21/01/05

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10.1145/1120725.1120800

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Li, K. S. M., Lee, C. L., Su, C., & Chen, J. E. (2005). Oscillation ring based interconnect test scheme for SOC. 於 Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 (頁 184-187). 文章 1466154 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; 卷 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/1120725.1120800

@inproceedings{2b1c75c6fce84a10bd6476d13c4ccce7,

title = "Oscillation ring based interconnect test scheme for SOC",

abstract = "We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of,the algorithm. Our method achieves 100% fault coverage with a small number of tests.",

author = "Li, {Katherine Shu Min} and Lee, {Chung Len} and Chauchin Su and Chen, {Jwu E.}",

year = "2005",

doi = "10.1145/1120725.1120800",

language = "???core.languages.en_GB???",

isbn = "0780387368",

series = "Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "184--187",

booktitle = "Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005",

note = "2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 ; Conference date: 18-01-2005 Through 21-01-2005",

}

Li, KSM, Lee, CL, Su, C & Chen, JE 2005, Oscillation ring based interconnect test scheme for SOC. 於 Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005., 1466154, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, 卷 1, Institute of Electrical and Electronics Engineers Inc., 頁 184-187, 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005, Shanghai, China, 18/01/05. https://doi.org/10.1145/1120725.1120800

Oscillation ring based interconnect test scheme for SOC. / Li, Katherine Shu Min; Lee, Chung Len; Su, Chauchin 等.
Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005. Institute of Electrical and Electronics Engineers Inc., 2005. p. 184-187 1466154 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; 卷 1).

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

TY - GEN

T1 - Oscillation ring based interconnect test scheme for SOC

AU - Li, Katherine Shu Min

AU - Lee, Chung Len

AU - Su, Chauchin

AU - Chen, Jwu E.

PY - 2005

Y1 - 2005

N2 - We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of,the algorithm. Our method achieves 100% fault coverage with a small number of tests.

AB - We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of,the algorithm. Our method achieves 100% fault coverage with a small number of tests.

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U2 - 10.1145/1120725.1120800

DO - 10.1145/1120725.1120800

M3 - 會議論文篇章

AN - SCOPUS:33748625610

SN - 0780387368

SN - 9780780387362

T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

SP - 184

EP - 187

BT - Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005

Y2 - 18 January 2005 through 21 January 2005

ER -

Li KSM, Lee CL, Su C, Chen JE. Oscillation ring based interconnect test scheme for SOC. 於 Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005. Institute of Electrical and Electronics Engineers Inc. 2005. p. 184-187. 1466154. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). doi: 10.1145/1120725.1120800

Oscillation ring based interconnect test scheme for SOC

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