Optical system to extract reflection coefficients and optical admittances of a thin film stack and its application in coating monitoring

Cheng Chung Lee, Kai Wu, Yu Jen Chen, Chien Cheng Kuo

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

1 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering

Material Science