Optical monitoring of silver-based transparent heat mirrors

Cheng Chung Lee; Shang Hui Chen; Cheng Chung Jaing

doi:10.1364/AO.35.005698

Optical monitoring of silver-based transparent heat mirrors

Cheng Chung Lee, Shang Hui Chen, Cheng Chung Jaing

光電科學與工程學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

63 引文斯高帕斯（Scopus）

摘要

Both three-layer (TiO₂–Ag–TiO₂) and five-layer (TiO₂–Ag–TiO₂–Ag–TiO₂) heat mirrors with optimum transmission in the visible and good reflectance in the IR have been designed by admittance diagram techniques. The mirrors were fabricated successfully by optical monitoring. An interesting anomalous layer was found and explained, and its equivalent refractive index and thickness are 2.015 — i0.016 and 2.56 nm, respectively.

原文	???core.languages.en_GB???
頁（從 - 到）	5698-5703
頁數	6
期刊	Applied Optics
卷	35
發行號	28
DOIs	https://doi.org/10.1364/AO.35.005698
出版狀態	已出版 - 1 10月 1996

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10.1364/AO.35.005698

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AB - Both three-layer (TiO2–Ag–TiO2) and five-layer (TiO2–Ag–TiO2–Ag–TiO2) heat mirrors with optimum transmission in the visible and good reflectance in the IR have been designed by admittance diagram techniques. The mirrors were fabricated successfully by optical monitoring. An interesting anomalous layer was found and explained, and its equivalent refractive index and thickness are 2.015 — i0.016 and 2.56 nm, respectively.

KW - Admittance diagram

KW - Anomalous layer

KW - Ion-assisted deposition

KW - Optical monitoring

KW - Transparent heat mirror

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Optical monitoring of silver-based transparent heat mirrors

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