An on-wafer measurement technique is performed to characterize the noise figure (NF) at millimeter-wave (MMW) band. Two NF-measurement techniques are reviewed, and the Y-factor method is discussed in detail. The measurement principles and considerations are proposed for the device under test (DUT) at MMW band. The test procedure and setups are performed to measure the V-band amplifier and mixer. The experimental results confirm the validity with high accuracy by comparing with the simulations.
|主出版物標題||2010 Asia-Pacific Microwave Conference Proceedings, APMC 2010|
|出版狀態||已出版 - 2010|
|事件||2010 Asia-Pacific Microwave Conference, APMC 2010 - Yokohama, Japan|
持續時間: 7 12月 2010 → 10 12月 2010
|名字||Asia-Pacific Microwave Conference Proceedings, APMC|
|???event.eventtypes.event.conference???||2010 Asia-Pacific Microwave Conference, APMC 2010|
|期間||7/12/10 → 10/12/10|