@inproceedings{265b3ae4e3f0403285077d2cd40553b4,
title = "On-wafer noise figure measurements of millimeter-wave LNA and mixer",
abstract = "An on-wafer measurement technique is performed to characterize the noise figure (NF) at millimeter-wave (MMW) band. Two NF-measurement techniques are reviewed, and the Y-factor method is discussed in detail. The measurement principles and considerations are proposed for the device under test (DUT) at MMW band. The test procedure and setups are performed to measure the V-band amplifier and mixer. The experimental results confirm the validity with high accuracy by comparing with the simulations.",
keywords = "low noise amplifiers, millimeter wave measurements, mixers, noise figure",
author = "Chang, {Yin Cheng} and Lin, {Shuw Guann} and Chiou, {Hwann Kaeo} and Chang, {Da Chiang} and Juang, {Ying Zong}",
year = "2010",
language = "???core.languages.en_GB???",
isbn = "9784902339222",
series = "Asia-Pacific Microwave Conference Proceedings, APMC",
pages = "1424--1427",
booktitle = "2010 Asia-Pacific Microwave Conference Proceedings, APMC 2010",
note = "2010 Asia-Pacific Microwave Conference, APMC 2010 ; Conference date: 07-12-2010 Through 10-12-2010",
}