@inproceedings{b0110c6ebaf0437dbb1d3616e1285e3e,
title = "On-wafer mm-wave V-band semi-automatic power measurement system",
abstract = "This paper proposes an on-wafer mm-wave V-band semi-automatic power measurement system (OMVSPMS) with some external passive attenuators (ATT) for mm-wave circuits and presents the calibration and measurement method programmed by standard commands for programmable instruments (SCPI) language with Agilent VEE software. Since accurate measurement results are desirable, for example, the 1-dB compression point (P1dB) and the input third order intercept point (IP3) are items of linearity for mm-wave active circuits. Both also need right power into device under test (DUT) to expect right P1dB and IP3. Therefore, an implementation of calibration and measurement method combined traditional mm-wave instruments with some external passive attenuators is used for accurate power generation of the stimulus and accurate power reception of the receiver.",
keywords = "automatic, measurement, On-wafer, power, V-band",
author = "Hsiao, {Hsu Feng} and Lin, {Shuw Guann} and Chiou, {Hwann Kaeo} and Chang, {Da Chiang} and Juang, {Ying Zong}",
year = "2010",
language = "???core.languages.en_GB???",
isbn = "9784902339222",
series = "Asia-Pacific Microwave Conference Proceedings, APMC",
pages = "1432--1435",
booktitle = "2010 Asia-Pacific Microwave Conference Proceedings, APMC 2010",
note = "2010 Asia-Pacific Microwave Conference, APMC 2010 ; Conference date: 07-12-2010 Through 10-12-2010",
}