TY - GEN
T1 - On-chip bus encoding for LC cross-talk reduction
AU - Huang, Jiun Sheng
AU - Tu, Shang Wei
AU - Jou, Jing Yang
PY - 2005
Y1 - 2005
N2 - With the continuous shrinkage of device sizes, the global interconnect delay becomes a dominant factor of chip performance in deep-submicron technology. Furthermore, as the working frequency of integrated circuits increasing above GHz, the inductive crosstalk will also have very significant influence on the global interconnect delay. However, most existing works consider only RC effects (the worst-case switching pattern resulting from coupling capacitance), to develop their encoding schemes to reduce bus delay. In this paper, we propose a flexible bus encoding method to reduce the LC coupling delay on on-chip bus with a user-given bus structure, the working frequency, and the delay constraint. Simulation results show that our encoding method can significantly reduce the coupling delay of a bus according to the delay constraint.
AB - With the continuous shrinkage of device sizes, the global interconnect delay becomes a dominant factor of chip performance in deep-submicron technology. Furthermore, as the working frequency of integrated circuits increasing above GHz, the inductive crosstalk will also have very significant influence on the global interconnect delay. However, most existing works consider only RC effects (the worst-case switching pattern resulting from coupling capacitance), to develop their encoding schemes to reduce bus delay. In this paper, we propose a flexible bus encoding method to reduce the LC coupling delay on on-chip bus with a user-given bus structure, the working frequency, and the delay constraint. Simulation results show that our encoding method can significantly reduce the coupling delay of a bus according to the delay constraint.
UR - http://www.scopus.com/inward/record.url?scp=33745446171&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2005.1500063
DO - 10.1109/VDAT.2005.1500063
M3 - 會議論文篇章
AN - SCOPUS:33745446171
SN - 0780390601
SN - 9780780390607
T3 - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
SP - 233
EP - 236
BT - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
T2 - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Y2 - 27 April 2005 through 29 April 2005
ER -