NVDimm-FE: A High-density 3D Architecture of 3-bit/c 2TnCFEto Break Great Memory Wall with 10 ns of PGM-pulse, 1010Cycles of Endurance, and Decade Lifetime at 103 °C

E. R. Hsieh, J. K. Chang, T. Y. Tang, Y. J. Li, C. W. Liang, M. Y. Lin, S. Y. Huang, C. J. Su, J. C. Guo, S. S. Chung

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

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Engineering & Materials Science