Novel Vertical Scanning Algorithm with Advanced Control to Increase Range and Accuracy of Differential Confocal Microscopy

Jim Wei Wu, Wei Chih Liu, Li Chen Fu

研究成果: 雜誌貢獻期刊論文同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Novel Vertical Scanning Algorithm with Advanced Control to Increase Range and Accuracy of Differential Confocal Microscopy」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Physics & Astronomy