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Novel Vertical Scanning Algorithm with Advanced Control to Increase Range and Accuracy of Differential Confocal Microscopy
Jim Wei Wu
, Wei Chih Liu, Li Chen Fu
電機工程學系
研究成果
:
雜誌貢獻
›
期刊論文
›
同行評審
6
引文 斯高帕斯(Scopus)
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Keyphrases
Differential Confocal Microscopy
100%
Vertical Scanning
100%
Scanning Algorithm
100%
Advanced Control
100%
Scanning Range
50%
External Disturbances
25%
Range Imaging
25%
System Parameters
25%
Sub-micrometer
25%
Highly Effective
25%
Hysteresis Effect
25%
Adaptive Sliding Mode Controller
25%
Scanning Trajectory
25%
Internal Model Principle
25%
3D Topography
25%
Microscopy System
25%
Scanning Step
25%
Piezoelectric Scanner
25%
Imaging Accuracy
25%
Computer Science
System Parameter
100%
adaptive sliding mode controller
100%
Internal Model
100%
Engineering
Confocal Microscopy
100%
External Disturbance
25%
System Parameter
25%
Piezoelectric
25%
Internals
25%
Hysteresis Effect
25%
Sliding Mode Controller
25%
Powerful Tool
25%