NLS based Modeling and Characterization of Switching Dynamics for Antiferroelectric/Ferroelectric Hafnium Zirconium Oxides

Yu Chen Chen, Kuo Yu Hsiang, Ying Tsan Tang, Min Hung Lee, Pin Su

研究成果: 書貢獻/報告類型會議論文篇章同行評審

10 引文 斯高帕斯(Scopus)

摘要

In this work, we have conducted an NLS-based Monte-Carlo modeling and characterization for antiferroelectric/ferroelectric (AFE/FE) Hf1-xZrxO2 (HZO). With the coexistence of orthorhombic-phase (FE) and tetragonal-phase (AFE) grains and the crucial consideration of back-switching field, our generalized NLS model is capable of describing the switching dynamics and frequency response of AFE/FE HZO. Our experimentally verified model is adequate for modeling HZO with certain AFE and FE properties, which can be beneficial to future memory applications and neuromorphic computing.

原文???core.languages.en_GB???
主出版物標題2021 IEEE International Electron Devices Meeting, IEDM 2021
發行者Institute of Electrical and Electronics Engineers Inc.
頁面15.4.1-15.4.4
ISBN(電子)9781665425728
DOIs
出版狀態已出版 - 2021
事件2021 IEEE International Electron Devices Meeting, IEDM 2021 - San Francisco, United States
持續時間: 11 12月 202116 12月 2021

出版系列

名字Technical Digest - International Electron Devices Meeting, IEDM
2021-December
ISSN(列印)0163-1918

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???event.eventtypes.event.conference???2021 IEEE International Electron Devices Meeting, IEDM 2021
國家/地區United States
城市San Francisco
期間11/12/2116/12/21

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