Nanostructures and optical properties of self-assembled Ge quantum dots grown in a hot wall UHV/CVD system

P. S. Chen, Z. Pei, S. W. Lee, M. J. Tsai, C. W. Liu

研究成果: 會議貢獻類型會議論文同行評審

2 引文 斯高帕斯(Scopus)

摘要

Self-assembled Ge quantum dots (QDs) grown in a commercial ultra-high-vacuum chemical vapor deposition (UHV/CVD) reactor were demonstrated in this work. The Ge QD morphology, size distribution and uniformity depend on the amount of Ge flux, growth temperature and deposition rate. With precise control of deposition rate, a layer by layer growth or island formation can be achieved at 550°C. At this growth temperature, the 6.8 eq-ML Ge hut cluster has a density of ∼1×1011 cm-2 with a broadening distribution. With increasing the growth temperature to 600°C, the uniformity of Ge QDs distribution is improved, but its density decreases to 4×109∼1.1×1010 cm-2(at 12 eq-ML Ge QDs, we found that the mean size of dome-shaped QDs is ∼45 nm). Optical transition from Ge QDs with a Si cap was also analyzed from photoluminescence spectra. With a growth interrupt before Ge deposition at 600°C, the size uniformity and density of QDs could be further improved. Partial hydrogen-coverage in the front of epitaxial growth would be responsible for these homogeneous Ge QDs grown at 600°C in this isothermal reactor.

原文???core.languages.en_GB???
頁面289-298
頁數10
出版狀態已出版 - 2004
事件SiGe: Materials, Processing, and Devices - Proceedings of the First Symposium - Honolulu, HI, United States
持續時間: 3 10月 20048 10月 2004

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???SiGe: Materials, Processing, and Devices - Proceedings of the First Symposium
國家/地區United States
城市Honolulu, HI
期間3/10/048/10/04

指紋

深入研究「Nanostructures and optical properties of self-assembled Ge quantum dots grown in a hot wall UHV/CVD system」主題。共同形成了獨特的指紋。

引用此