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Monitoring the progressive development of an anodized film on aluminum
Pai Sheng Wei,
Teng Shih Shih
機械工程學系
研究成果
:
雜誌貢獻
›
期刊論文
›
同行評審
10
引文 斯高帕斯(Scopus)
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深入研究「Monitoring the progressive development of an anodized film on aluminum」主題。共同形成了獨特的指紋。
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Keyphrases
Progressive Development
100%
Anodized Film
100%
Anodic Film
100%
Anodic Potential
66%
Pore Expansion
66%
High-resolution
33%
Nanostructures
33%
Anodic
33%
Quasi-steady State
33%
Field Emission Scanning Electron Microscopy (FE-SEM)
33%
Acid Concentration
33%
Transmission Electron Microscopy
33%
Current Density
33%
Electrochemical Performance
33%
Layer Formation
33%
Processing Time
33%
Barrier Layer
33%
Bath Temperature
33%
Anodizing Treatment
33%
Four-step
33%
Nanopore
33%
Processing Conditions
33%
Aluminum Sheet
33%
Al 1050
33%
Sulfuric Acid Solution
33%
Steady-state Growth
33%
Material Science
Aluminum
100%
Film
100%
Anodic Film
100%
Anodizing
66%
Density
33%
Pitting Corrosion
33%
Transmission Electron Microscopy
33%
Field Emission Scanning Electron Microscopy
33%
Nanopore
33%
Aluminum Sheet
33%
Nanostructure
33%
Chemical Engineering
Film
100%
Sulfuric Acid
25%
Nanostructure
25%