Modeling and testing comparison faults of memristive ternary content addressable memories

Li Wei Deng, Jin Fu Li, Yong Xiao Chen

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

Ternary content addressable memory (TCAM) is widely used for the network applications. However, TCAM is a power-and area-consuming component. Memristor-based TCAM is considered as a good alternative for reducing the required power and area. In this paper, we define comparison faults of 5T2R memristor-based TCAMs. Electrical defects such as transistor stuck-open/stuck-on, resistive open, short, and bridge are comprehensively injected and simulated by Hspice. We also propose a March-like test March-MCAM to fully cover the defined comparison faults. March-MCAM requires 6N Write operations and (14N + 2B) Compare operations for an N × B-bit mrTCAM.

原文???core.languages.en_GB???
主出版物標題Proceedings - 2018 23rd IEEE European Test Symposium, ETS 2018
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1-6
頁數6
ISBN(電子)9781538637289
DOIs
出版狀態已出版 - 29 6月 2018
事件23rd IEEE European Test Symposium, ETS 2018 - Bremen, Germany
持續時間: 28 5月 20181 6月 2018

出版系列

名字Proceedings of the European Test Workshop
2018-May
ISSN(列印)1530-1877
ISSN(電子)1558-1780

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???event.eventtypes.event.conference???23rd IEEE European Test Symposium, ETS 2018
國家/地區Germany
城市Bremen
期間28/05/181/06/18

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