摘要
The effects of nominal indium content on compositional fluctuation and structure defects in InGaN/GaN multiple quantum well (QW) structures were reported. The samples were grown in a metallorganic chemical vapor deposition (MOCVD) reactor and consisted of five or ten periods of Si-doped InGaN wells with 3-nm thickness. Material microanalyses of the quantum well structures revealed better confinement of indium-aggregated clusters within wells in samples of lower indium contents and indium-rich precipitates aggregating near V-shape defects.
| 原文 | ???core.languages.en_GB??? |
|---|---|
| 頁面 | II218-II219 |
| 出版狀態 | 已出版 - 2001 |
| 事件 | 4th Pacific Rim Conference on Lasers and Electro-Optics - Chiba, Japan 持續時間: 15 7月 2001 → 19 7月 2001 |
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| ???event.eventtypes.event.conference??? | 4th Pacific Rim Conference on Lasers and Electro-Optics |
|---|---|
| 國家/地區 | Japan |
| 城市 | Chiba |
| 期間 | 15/07/01 → 19/07/01 |