摘要
In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers (OP) is demonstrated and presented. The methodology, at first, presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. An application of the derived models to Monte-Carlo simulation to save computation time is also demonstrated.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 90-95 |
頁數 | 6 |
期刊 | Proceedings of the Asian Test Symposium |
出版狀態 | 已出版 - 2000 |
事件 | 9th Asian Test Symposium - Taipei, Taiwan 持續時間: 4 12月 2000 → 6 12月 2000 |