Methodology for fault model development for hierarchical linear systems

Yin Chao Huang, Chung Len Lee, Jun Weir Lin, Jwu E. Chen, Chau chin Su

研究成果: 雜誌貢獻會議論文同行評審

2 引文 斯高帕斯(Scopus)

摘要

In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers (OP) is demonstrated and presented. The methodology, at first, presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. An application of the derived models to Monte-Carlo simulation to save computation time is also demonstrated.

原文???core.languages.en_GB???
頁(從 - 到)90-95
頁數6
期刊Proceedings of the Asian Test Symposium
出版狀態已出版 - 2000
事件9th Asian Test Symposium - Taipei, Taiwan
持續時間: 4 12月 20006 12月 2000

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