Method to evaluate afterpulsing probability in single-photon avalanche diodes

Bo Wei Tzou, Jau Yang Wu, Yi Shan Lee, Sheng Di Lin

研究成果: 雜誌貢獻期刊論文同行評審

4 引文 斯高帕斯(Scopus)

摘要

We propose and demonstrate a new method for evaluating the afterpulsing effect in single-photon avalanche photodiodes (SPADs). By analyzing the statistical property of dark count rate, we can quantitatively characterize afterpulsing probability (APP) of a SPAD. In experiment, the temperature- dependent low dark count rate (DCR) distribution becomes non-Poissonian at lower temperature and has higher excess bias as the afterpulsing effect becomes significant. Our work provides a flexible way to examine APP in either single-device or circuit level.

原文???core.languages.en_GB???
頁(從 - 到)3774-3777
頁數4
期刊Optics Letters
40
發行號16
DOIs
出版狀態已出版 - 2015

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