Memory fault diagnosis by syndrome compression

Jin Fu Li, Cheng Wen Wu

研究成果: 雜誌貢獻會議論文同行評審

30 引文 斯高帕斯(Scopus)

摘要

In this paper we present a data compression technique that can be used to speed up the transmission of diagnosis data from the embedded RAM with built-in self-diagnosis (BISD) support. The proposed approach compresses the faulty-cell address and March syndrome to about 28% of the original size under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9% for a 1Mb SRAM with 164 faults. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage capacity requirement.

原文???core.languages.en_GB???
文章編號915007
頁(從 - 到)97-101
頁數5
期刊Proceedings -Design, Automation and Test in Europe, DATE
DOIs
出版狀態已出版 - 2001
事件Design, Automation and Test in Europe Conference and Exhibition 2001, DATE 2001 - Munich, Germany
持續時間: 13 3月 200116 3月 2001

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