Measurements of nanometer surface structure by incoherent confocal laser-feedback

Kung Li Deng, Chun Hung Lu, Jyhpyng Wang, Po Hsiu Cheng

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

An optical scanning microscope is developed using the confocal laser feedback technique on a superluminescent laser diode with bias current detection capable of measuring surface structure with 20 nm depth resolution and micrometers dynamic range. This paper describes the measurement techniques of nanometer surface structure using incoherent confocal laser feedback.

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主出版物標題Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting
發行者Publ by IEEE
ISBN(列印)0780319710
出版狀態已出版 - 1994
事件Proceedings of the Conference on Lasers and Electro-Optics - Anaheim, CA, USA
持續時間: 8 5月 199413 5月 1994

出版系列

名字Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting
8

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???event.eventtypes.event.conference???Proceedings of the Conference on Lasers and Electro-Optics
城市Anaheim, CA, USA
期間8/05/9413/05/94

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