Measurement error analysis and calibration techniques for built-in jitter measurement circuit

Keyphrases

• Calibration Method 100%
• Error Calibration 100%
• Measuring Circuit 100%
• Build-in Jitter Measurement 100%
• Measurement Error Analysis 100%
• Timing Resolution 42%
• Measurement Error 28%
• Time Amplifier 28%
• Vernier Ring Oscillator 28%
• Error Sources 14%
• 90-nm CMOS Technology 14%
• CMOS Process 14%
• Jitter 14%
• Clock Frequency 14%
• Self-calibration 14%
• In(III) 14%
• Clock Jitter 14%
• Gaussian Distribution 14%
• Jitter Free 14%
• Reference Signal 14%
• Automatic Calibration 14%
• Resolution Calibration 14%
• Process Variation Effect 14%
• High-speed Transceiver 14%
• Oscillator-Amplifier 14%

Engineering

• Measurement Error 100%
• Amplifier 66%
• Oscillator 66%
• System-on-Chip 33%
• Gaussians 33%
• Clock Frequency 33%
• Transceiver 33%
• Reference Signal 33%
• Error Source 33%
• Process Variation 33%