Marking oxide films on the section of Al-XSi alloys by ultrasonic-vibration treatment

Yeong Jern Chen, Li Wu Huang, Teng Shih Shih

研究成果: 雜誌貢獻期刊論文同行評審

7 引文 斯高帕斯(Scopus)

摘要

Oxide films entrapped in Al-XSi alloys with an X from 0% to 13% are different, and can be identified by the presented ultrasonic-vibration treatment. After polishing and ultrasonic-vibration treatment, the surfaces or castings then show differently shaped foggy marks, including lumps, flakes, strips or spots. Oxide films fracture and particles become detached from the film during ultrasonic-vibration treatment. The polished surface thus becomes partly eroded after treatment, and these eroded areas are visibly as differently shaped foggy marks. This paper presents a sequential summary of the formation of these eroded areas, foggy marks, in samples of pure aluminum and Al-XSi alloys during ultrasonic-vibration treatment.

原文???core.languages.en_GB???
頁(從 - 到)1190-1197
頁數8
期刊Materials Transactions
44
發行號6
DOIs
出版狀態已出版 - 6月 2003

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