LCD mura detection based on accumulated differences and multi-resolution background subtraction

You Ching Lee, Cheng En Shie, Din Chang Tseng

研究成果: 書貢獻/報告類型會議論文篇章同行評審

4 引文 斯高帕斯(Scopus)

摘要

A mura detection approach based on the difference accumulation and background estimation is proposed to detect mura in the thin film transistor liquid crystal display (TFT-LCD) images. We were motivated by wavelet transform to derive a multi-resolution method for accelerating the detecting speed of background estimation. While the visibility of mura depends on inspecting angles and online environmental light luminance, sometimes the defects may be invisible in the observed images. Thus, we calibrate the non-uniform luminance and accumulate the continuous online images for depressing noise and enhancing the contrast between mura and background. However, the online moving speed is unstable; thus, we propose a full-automatic non-uniform displacement calibration method. We demonstrate them by applying to real and artificial online image sequences. The efficiency and effect is described in experiments. Our methods are also compared with other mura detecting methods.

原文???core.languages.en_GB???
主出版物標題Proceedings of the 5th International Conference on Image and Graphics, ICIG 2009
發行者IEEE Computer Society
頁面189-194
頁數6
ISBN(列印)9780769538839
DOIs
出版狀態已出版 - 2009
事件5th International Conference on Image and Graphics, ICIG 2009 - Xi'an, Shanxi, China
持續時間: 20 9月 200923 9月 2009

出版系列

名字Proceedings of the 5th International Conference on Image and Graphics, ICIG 2009

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???event.eventtypes.event.conference???5th International Conference on Image and Graphics, ICIG 2009
國家/地區China
城市Xi'an, Shanxi
期間20/09/0923/09/09

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