Investigation of thin TiO 2 films cosputtered with Si species

Jin Cherng Hsu, Cheng Chung Lee, Huang Lu Chen, Chien Cheng Kuo, Paul W. Wang

研究成果: 雜誌貢獻期刊論文同行評審

3 引文 斯高帕斯(Scopus)

摘要

Titanium dioxide (TiO 2 ) films were fabricated by cosputtering titanium (Ti) target and SiO 2 or Si slice with ion-beam-sputtering deposition (IBSD) technique and were postannealed at 450 °C for 6 h. The variations of oxygen bonding, which included high-binding-energy oxygen (HBO), bridging oxygen (BO), low-binding-energy oxygen (LBO), and three chemical states of titanium (Ti 4+ , Ti 3+ and Ti 2+ ) were analyzed by X-ray photoelectron spectroscopy (XPS). The enhancement of HBO and reduction of BO in O 1s spectra as functions of SiO 2 or Si amount in cosputtered film imply the formation of Si-O-Ti linkage. Corresponding increase of Ti 3+ in Ti 2p spectra further confirmed the property modification of the cosputtered film resulting from the variation of the chemical bonding. An observed correlation between the chemical structure and optical properties, refractive index and extinction coefficient, of the SiO 2 or Si cosputtered films demonstrated that the change of chemical bonding in the film results in the modification of optical properties. Furthermore, it was found that the optical properties of the cosputtered films were strongly depended on the cosputtering targets. In case of the Si cosputtered films both the refractive indices and extinction coefficients were reduced after postannealing, however, the opposite trend was observed in SiO 2 cosputtered films.

原文???core.languages.en_GB???
頁(從 - 到)4852-4858
頁數7
期刊Applied Surface Science
255
發行號9
DOIs
出版狀態已出版 - 15 2月 2009

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