Investigation of the time dependent gate dielectric stability in SiC MOSFETs with planar and trench gate structures

Wei Cheng Lin, Wei Chen Yu, Bang Ren Chen, Yu Sheng Hsiao, Zhen Hong Huang, Chia Lung Hung, Yi Kai Hsiao, Nai Jen Yeh, Hao Chung Kuo, Chang Ching Tu, Tian Li Wu

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

6 引文 斯高帕斯（Scopus）

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Engineering

Earth and Planetary Sciences