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Investigation of the efficiency-droop mechanism in vertical red light-emitting diodes using a dynamic measurement technique
J. W. Shi
, F. M. Kuo
, Che Wei Lin
, Wei Chen
, L. J. Yan
, J. K. Sheu
電機工程學系
研究成果
:
雜誌貢獻
›
期刊論文
›
同行評審
8
引文 斯高帕斯(Scopus)
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深入研究「Investigation of the efficiency-droop mechanism in vertical red light-emitting diodes using a dynamic measurement technique」主題。共同形成了獨特的指紋。
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Keyphrases
Measurement Techniques
100%
Efficiency Droop
100%
Dynamic Measurement
100%
Red Light-emitting Diode
100%
Bias Current
66%
Impulse Response
66%
AlGaInP
66%
Room Temperature
33%
Power Output
33%
Response Time
33%
Carrier Leakage
33%
Ambient Temperature
33%
Diode Structures
33%
Low Bias
33%
Fall Time
33%
Optical Pulses
33%
High Bias
33%
Defect Recombination
33%
Vertical Light-emitting Diodes
33%
Thermally Induced
33%
Heat Sink
33%
Optical Response
33%
Carrier Dynamics
33%
Electrical Pulse
33%
Photoreceiver
33%
Recombination Mechanism
33%
Response Degradation
33%
Engineering
Light-Emitting Diode
100%
Efficiency Droop
100%
Red Light
100%
Impulse Response
50%
Output Power
25%
Room Temperature
25%
Response Time
25%
Carrier Leakage
25%
Optical Pulse
25%
Fall Time
25%
Spontaneous Recombination
25%
Material Science
Light-Emitting Diode
100%
Electronic Circuit
25%