Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique

J. W. Shi; Che Wei Lin; Wei Chen; M. L. Lee; J. K. Sheu

doi:10.1109/PHO.2011.6110747

Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique

J. W. Shi, Che Wei Lin, Wei Chen, M. L. Lee, J. K. Sheu

電機工程學系

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

摘要

Electrical-optical pump-probe is used to investigate GaN blue LEDs under different temperatures. Measurement result indicates that under moderate current density (∼200A/cm ²) piezoelectric field induced carrier-escaping cannot be neglected and is responsible for the observed efficiency-droop.

原文	???core.languages.en_GB???
主出版物標題	IEEE Photonic Society 24th Annual Meeting, PHO 2011
頁面	709-710
頁數	2
DOIs	https://doi.org/10.1109/PHO.2011.6110747
出版狀態	已出版 - 2011
事件	24th Annual Meeting on IEEE Photonic Society, PHO 2011 - Arlington, VA, United States 持續時間: 9 10月 2011 → 13 10月 2011

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名字	IEEE Photonic Society 24th Annual Meeting, PHO 2011

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	24th Annual Meeting on IEEE Photonic Society, PHO 2011
國家/地區	United States
城市	Arlington, VA
期間	9/10/11 → 13/10/11

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10.1109/PHO.2011.6110747

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Shi, J. W., Lin, C. W., Chen, W., Lee, M. L., & Sheu, J. K. (2011). Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique. 於 IEEE Photonic Society 24th Annual Meeting, PHO 2011 (頁 709-710). 文章 6110747 (IEEE Photonic Society 24th Annual Meeting, PHO 2011). https://doi.org/10.1109/PHO.2011.6110747

@inproceedings{0ad1fc69ddf64a9e9c4cf2916d516891,

title = "Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique",

abstract = "Electrical-optical pump-probe is used to investigate GaN blue LEDs under different temperatures. Measurement result indicates that under moderate current density (∼200A/cm 2) piezoelectric field induced carrier-escaping cannot be neglected and is responsible for the observed efficiency-droop.",

author = "Shi, {J. W.} and Lin, {Che Wei} and Wei Chen and Lee, {M. L.} and Sheu, {J. K.}",

year = "2011",

doi = "10.1109/PHO.2011.6110747",

language = "???core.languages.en_GB???",

isbn = "9781424489404",

series = "IEEE Photonic Society 24th Annual Meeting, PHO 2011",

pages = "709--710",

booktitle = "IEEE Photonic Society 24th Annual Meeting, PHO 2011",

note = "24th Annual Meeting on IEEE Photonic Society, PHO 2011 ; Conference date: 09-10-2011 Through 13-10-2011",

}

Shi, JW, Lin, CW, Chen, W, Lee, ML & Sheu, JK 2011, Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique. 於 IEEE Photonic Society 24th Annual Meeting, PHO 2011., 6110747, IEEE Photonic Society 24th Annual Meeting, PHO 2011, 頁 709-710, 24th Annual Meeting on IEEE Photonic Society, PHO 2011, Arlington, VA, United States, 9/10/11. https://doi.org/10.1109/PHO.2011.6110747

Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique. / Shi, J. W.; Lin, Che Wei; Chen, Wei 等.
IEEE Photonic Society 24th Annual Meeting, PHO 2011. 2011. p. 709-710 6110747 (IEEE Photonic Society 24th Annual Meeting, PHO 2011).

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

TY - GEN

T1 - Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique

AU - Shi, J. W.

AU - Lin, Che Wei

AU - Chen, Wei

AU - Lee, M. L.

AU - Sheu, J. K.

PY - 2011

Y1 - 2011

N2 - Electrical-optical pump-probe is used to investigate GaN blue LEDs under different temperatures. Measurement result indicates that under moderate current density (∼200A/cm 2) piezoelectric field induced carrier-escaping cannot be neglected and is responsible for the observed efficiency-droop.

AB - Electrical-optical pump-probe is used to investigate GaN blue LEDs under different temperatures. Measurement result indicates that under moderate current density (∼200A/cm 2) piezoelectric field induced carrier-escaping cannot be neglected and is responsible for the observed efficiency-droop.

UR - http://www.scopus.com/inward/record.url?scp=84862939049&partnerID=8YFLogxK

U2 - 10.1109/PHO.2011.6110747

DO - 10.1109/PHO.2011.6110747

M3 - 會議論文篇章

AN - SCOPUS:84862939049

SN - 9781424489404

T3 - IEEE Photonic Society 24th Annual Meeting, PHO 2011

SP - 709

EP - 710

BT - IEEE Photonic Society 24th Annual Meeting, PHO 2011

T2 - 24th Annual Meeting on IEEE Photonic Society, PHO 2011

Y2 - 9 October 2011 through 13 October 2011

ER -

Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique

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