Investigation of a-Si:H films passivation quality by ECRCVD and application of silicon heterojunction solar cells

Yen Ho Chu, Chien Chieh Lee, Teng Hsiang Chang, Yu Lin Hsieh, Jenq Yang Chang, Tomi Li, I. Chen Chen

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

摘要

We investigated the quality of intrinsic layer by modulating the hydrogen dilution ratio (H2/SiH4) at various growth temperatures. The results of lifetime measurements indicate that a-Si:H intrinsic layer can successfully obtained the effective life time (∼446us) and the implied open circuit voltage (∼0.69 mV) under hydrogen dilution ratio (RH = 2) at 130°C even with high growth rate (>0.7 nm/s), that is good for industry production. The Voc increased about 28.3 and 32.2 mV with inserting a passivation layer (6 nm) on planar and texture c-Si wafer, respectively. Furthermore, with the addition of ITO as anti-reflection layer, we obtained that the conversion efficiency of texture HIT solar cell without back surface field (BSF) is 15.1% (active area = 0.783cm2) with V oc = 563 mV, Jsc = 36.7 mA, and FF = 73.1%.

原文???core.languages.en_GB???
主出版物標題Proceedings of AM-FPD 2014 - The 21st International Workshop on Active-Matrix Flatpanel Displays and Devices
主出版物子標題TFT Technologies and FPD Materials
發行者IEEE Computer Society
頁面217-220
頁數4
ISBN(列印)9784863483958
DOIs
出版狀態已出版 - 2014
事件21st International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, AM-FPD 2014 - Kyoto, Japan
持續時間: 2 7月 20144 7月 2014

出版系列

名字Proceedings of AM-FPD 2014 - The 21st International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials

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???event.eventtypes.event.conference???21st International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, AM-FPD 2014
國家/地區Japan
城市Kyoto
期間2/07/144/07/14

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