Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

An Chi Wei, Jyh Rou Sze

研究成果: 雜誌貢獻 › 會議論文 › 同行評審

指紋

深入研究「Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling」主題。共同形成了獨特的指紋。

Keyphrases

Chemical Engineering