每年專案
摘要
Rigorous coupled wave analysis and Monte Carlo ray tracing techniques are combined together for modeling the optical performance of OLED. The simulated and the measured results have shown agreement with each other.
原文 | ???core.languages.en_GB??? |
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文章編號 | JTu5A.7 |
期刊 | Optics InfoBase Conference Papers |
出版狀態 | 已出版 - 2015 |
事件 | Optics and Photonics for Energy and the Environment, E2 2015 - Suzhou, China 持續時間: 2 11月 2015 → 5 11月 2015 |
指紋
深入研究「Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling」主題。共同形成了獨特的指紋。專案
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