Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

An Chi Wei, Jyh Rou Sze

研究成果: 雜誌貢獻會議論文同行評審

摘要

Rigorous coupled wave analysis and Monte Carlo ray tracing techniques are combined together for modeling the optical performance of OLED. The simulated and the measured results have shown agreement with each other.

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文章編號JTu5A.7
期刊Optics InfoBase Conference Papers
出版狀態已出版 - 2015
事件Optics and Photonics for Energy and the Environment, E2 2015 - Suzhou, China
持續時間: 2 11月 20155 11月 2015

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