Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

An Chi Wei, Jyh Rou Sze

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

Rigorous coupled wave analysis and Monte Carlo ray tracing techniques are combined together for modeling the optical performance of OLED. The simulated and the measured results have shown agreement with each other.

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主出版物標題Optics and Photonics for Energy and the Environment, E2 2015
發行者Optica Publishing Group (formerly OSA)
ISBN(電子)9781557528209
出版狀態已出版 - 2015
事件Optics and Photonics for Energy and the Environment, E2 2015 - Suzhou, China
持續時間: 2 11月 20155 11月 2015

出版系列

名字Optics InfoBase Conference Papers

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???event.eventtypes.event.conference???Optics and Photonics for Energy and the Environment, E2 2015
國家/地區China
城市Suzhou
期間2/11/155/11/15

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