Integratable SiGe phototransistor with high speed (BW = 3 GHz) and extremely-high avalanche responsivity

Z. Pei, J. W. Shi, Y. M. Hsu, F. Yuan, C. S. Liang, C. W. Liu, T. M. Pan, S. C. Lu, W. Y. Hsieh, M. J. Tsai

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

摘要

SiGe phototransistors (HPT) with SiGe/Si multiple quantum well (MQW) absorption layers have been demonstrated to have high responsivity, GHz bandwidth and infrared (1.3 and 1.55 nm) detection ability, and can be used for gigabit optical communication applications [1]. To facilitate the integration with the following amplification circuitry, the SiGe/Si MQW absorption layers can be removed for the 850 nm wavelength detection. Moreover, the speed and avalanche responsivity are further enhanced by proper design of the non-ideal (nkT) base current, with a reasonable normal responsivity. The integrated photoreceiver using commercial SiGe/Si HBT foundry is feasible.

原文???core.languages.en_GB???
主出版物標題2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁面18-19
頁數2
ISBN(電子)0780381394, 9780780381391
DOIs
出版狀態已出版 - 2003
事件International Semiconductor Device Research Symposium, ISDRS 2003 - Washington, United States
持續時間: 10 12月 200312 12月 2003

出版系列

名字2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings

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???event.eventtypes.event.conference???International Semiconductor Device Research Symposium, ISDRS 2003
國家/地區United States
城市Washington
期間10/12/0312/12/03

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