Innovative Practice on Wafer Test Innovations

Keyphrases

• On-wafer Measurement 100%
• Automatic Test Equipment 100%
• Innovative Practices 100%
• Statistical Analysis 66%
• Taiwan 33%
• Structure Design 33%
• Pattern Recognition 33%
• Test Cost 33%
• AI-based Methods 33%
• Integrated Innovation 33%
• Defect Diagnosis 33%
• Wafer Defect Pattern 33%
• Wafer Defects 33%
• Wafer Patterns 33%
• Yield Prediction 33%
• 2.5D Interposer 33%
• Interposer Technology 33%
• Integral Structure 33%
• Innovative Work 33%

Engineering

• Test Equipment 100%
• Test System 66%
• Pattern Recognition 33%
• Metrics 33%
• Interposer 33%
• Artificial Intelligence 33%