In situ TEM and energy dispersion spectrometer analysis of chemical composition change in ZnO nanowire resistive memories

Yu Ting Huang, Shih Ying Yu, Cheng Lun Hsin, Chun Wei Huang, Chen Fang Kang, Fu Hsuan Chu, Jui Yuan Chen, Jung Chih Hu, Lien Tai Chen, Jr Hau He, Wen Wei Wu

研究成果: 雜誌貢獻期刊論文同行評審

39 引文 斯高帕斯(Scopus)

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Keyphrases

Material Science