In situ TEM and energy dispersion spectrometer analysis of chemical composition change in ZnO nanowire resistive memories
Yu Ting Huang, Shih Ying Yu, Cheng Lun Hsin, Chun Wei Huang, Chen Fang Kang, Fu Hsuan Chu, Jui Yuan Chen, Jung Chih Hu, Lien Tai Chen, Jr Hau He, Wen Wei Wu
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
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引文
斯高帕斯（Scopus）