摘要
Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nanosize oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.
原文 | ???core.languages.en_GB??? |
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文章編號 | 191110 |
期刊 | Applied Physics Letters |
卷 | 98 |
發行號 | 19 |
DOIs | |
出版狀態 | 已出版 - 9 5月 2011 |