Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation

W. Y. Chen, M. J. Chen, C. C. Cheng, T. M. Hsu, C. J. Wang, J. I. Chyi

研究成果: 雜誌貢獻期刊論文同行評審

1 引文 斯高帕斯(Scopus)

摘要

Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nanosize oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.

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文章編號191110
期刊Applied Physics Letters
98
發行號19
DOIs
出版狀態已出版 - 9 5月 2011

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