Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-Oxidation

W. Y. Chen, M. J. Chen, C. C. Cheng, C. J. Wang, J. I. Chyi, T. M. Hsu

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nano-size oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.

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主出版物標題CLEO
主出版物子標題Applications and Technology, CLEO_AT 2012
頁面JTh2A.97
出版狀態已出版 - 2012
事件CLEO: Applications and Technology, CLEO_AT 2012 - San Jose, CA, United States
持續時間: 6 5月 201211 5月 2012

出版系列

名字CLEO: Applications and Technology, CLEO_AT 2012

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???event.eventtypes.event.conference???CLEO: Applications and Technology, CLEO_AT 2012
國家/地區United States
城市San Jose, CA
期間6/05/1211/05/12

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