IEEE standard 1500 compatible oscillation ring test methodology for interconnect delay and crosstalk detection

Katherine Shu Min Li, Chung Len Lee, Chauchin Su, Jwu E. Chen

研究成果: 雜誌貢獻期刊論文同行評審

13 引文 斯高帕斯(Scopus)

摘要

A novel oscillation ring (OR) test scheme and architecture for testing interconnects in SOC is proposed and demonstrated. In addition to stuck-at and open faults, this scheme can also detect delay faults and crosstalk glitches, which are otherwise very difficult to be tested under the traditional test schemes. IEEE Std. 1500 wrapper cells are modified to accommodate the test scheme. An efficient algorithm is proposed to construct ORs for SOC based on a graph model. Experimental results on MCNC benchmark circuits have been included to show the effectiveness of the algorithm. In all experiments, the scheme achieves 100% fault coverage with a small number of tests.

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頁(從 - 到)341-355
頁數15
期刊Journal of Electronic Testing: Theory and Applications (JETTA)
23
發行號4
DOIs
出版狀態已出版 - 8月 2007

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