IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

Katherine Shu Min Li; Yao Wen Chang; Chauchin Su; Chung Len Lee; Jwu E. Chen

doi:10.1145/1118299.1118391

IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

Katherine Shu Min Li, Yao Wen Chang, Chauchin Su, Chung Len Lee, Jwu E. Chen

電機工程學系

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

摘要

We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.

原文	???core.languages.en_GB???
主出版物標題	Proceedings of the ASP-DAC 2006
主出版物子標題	Asia and South Pacific Design Automation Conference 2006
發行者	Institute of Electrical and Electronics Engineers Inc.
頁面	366-371
頁數	6
ISBN（列印）	0780394518, 9780780394513
DOIs	https://doi.org/10.1145/1118299.1118391
出版狀態	已出版 - 2006
事件	ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 - Yokohama, Japan 持續時間: 24 1月 2006 → 27 1月 2006

出版系列

名字	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
卷	2006

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006
國家/地區	Japan
城市	Yokohama
期間	24/01/06 → 27/01/06

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10.1145/1118299.1118391

引用此

Li, K. S. M., Chang, Y. W., Su, C., Lee, C. L., & Chen, J. E. (2006). IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. 於 Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 (頁 366-371). 文章 1594710 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; 卷 2006). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/1118299.1118391

Li, Katherine Shu Min ; Chang, Yao Wen ; Su, Chauchin 等. / IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. Institute of Electrical and Electronics Engineers Inc., 2006. 頁 366-371 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

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title = "IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults",

abstract = "We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.",

author = "Li, {Katherine Shu Min} and Chang, {Yao Wen} and Chauchin Su and Lee, {Chung Len} and Chen, {Jwu E.}",

year = "2006",

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language = "???core.languages.en_GB???",

isbn = "0780394518",

series = "Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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booktitle = "Proceedings of the ASP-DAC 2006",

note = "ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 ; Conference date: 24-01-2006 Through 27-01-2006",

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Li, KSM, Chang, YW, Su, C, Lee, CL & Chen, JE 2006, IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. 於 Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006., 1594710, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, 卷 2006, Institute of Electrical and Electronics Engineers Inc., 頁 366-371, ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006, Yokohama, Japan, 24/01/06. https://doi.org/10.1145/1118299.1118391

IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. / Li, Katherine Shu Min; Chang, Yao Wen; Su, Chauchin 等.
Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. Institute of Electrical and Electronics Engineers Inc., 2006. p. 366-371 1594710 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; 卷 2006).

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

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T1 - IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

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AU - Chang, Yao Wen

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AU - Lee, Chung Len

AU - Chen, Jwu E.

PY - 2006

Y1 - 2006

N2 - We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.

AB - We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.

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M3 - 會議論文篇章

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SN - 9780780394513

T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

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BT - Proceedings of the ASP-DAC 2006

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006

Y2 - 24 January 2006 through 27 January 2006

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Li KSM, Chang YW, Su C, Lee CL, Chen JE. IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. 於 Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. Institute of Electrical and Electronics Engineers Inc. 2006. p. 366-371. 1594710. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). doi: 10.1145/1118299.1118391

IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

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