Identification of robust untestable path delay faults

Wen Ching Wu, Chung Len Lee, Jwu E. Chen

研究成果: 雜誌貢獻會議論文同行評審

1 引文 斯高帕斯(Scopus)

摘要

This paper presents a theoretical analysis to identify robust untestable path delay faults. It first classifies the path reconvergence of fanouts into seven cases and deduces the necessary conditions to robustly test path delay faults for each case. It then proposes a procedure, based on the deduced conditions, to identify the robust untestable path delay faults. The procedure was applied to ISCAS 85' circuits[1] and it was found that the robust untestable faults occupy a high percentage of the total path delay faults. In addition, it also presents a method to estimate the number of robust untestable path delay faults for a circuit.

原文???core.languages.en_GB???
頁(從 - 到)229-235
頁數7
期刊Proceedings of the Asian Test Symposium
出版狀態已出版 - 1995
事件Proceedings of the 1995 4th Asian Test Symposium - Bangalore, India
持續時間: 23 11月 199524 11月 1995

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