Hybrid SnBi/SAC Low-Temperature Solder Bump

Albert T. Wu, Jui Lin Chao, Yu Yuan Lai, Chang Meng Wang

研究成果: 書貢獻/報告類型會議論文篇章同行評審

3 引文 斯高帕斯(Scopus)

摘要

Assembling advanced electronic packaging at low temperature attracts attentions from the industry. One of the advantages is to reduce the warpage of dies and enhance long-term reliability of the chips. Although eutectic SnBi is considered a widely accepted low-temperature solder, Bi segregation after annealing drastically degrades the mechanical strength. In this study, two layers of materials, a pre-solder (Sn-0.3Ag-0.7 Cu, SAC0307) and a low temperature solder (Sn-56Bi-1Ag-0.2Cu, SB102) was reflowed sequentially to create a hybrid solder joint. The reflow temperatures were set as 170 and 190 oC, which are much lower than that of the SAC solder. Adding SAC0307 reduces the Bi content in the joint and lessens the formation of Bi-rich phase. Comparing with SB 102 joint, the hybrid bond shows increasing joint strength after aging. The facture surface indicates that hybrid joint exhibits ductile fracture mode while SB 102 joint shows brittle mode. The results prove that SAC0307/SB102 hybrid solder joint can be a promising candidate for low-temperature application for advanced electronic packaging.

原文???core.languages.en_GB???
主出版物標題2023 International Conference on Electronics Packaging, ICEP 2023
發行者Institute of Electrical and Electronics Engineers Inc.
頁面213-214
頁數2
ISBN(電子)9784991191152
DOIs
出版狀態已出版 - 2023
事件22nd International Conference on Electronics Packaging, ICEP 2023 - Kumamoto, Japan
持續時間: 19 4月 202322 4月 2023

出版系列

名字2023 International Conference on Electronics Packaging, ICEP 2023

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???event.eventtypes.event.conference???22nd International Conference on Electronics Packaging, ICEP 2023
國家/地區Japan
城市Kumamoto
期間19/04/2322/04/23

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