How to cut out expired data with nearly zero overhead for solid-state drives

Wei Lin Wang, Tseng Yi Chen, Yuan Hao Chang, Hsin Wen Wei, Wei Kuan Shih

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

Owing to flash memory constraints, a garbage collection (GC) mechanism hurts flash storage lifespan and performance since it generates a massive amount of write data to flash memory. To add insult to injury, all GC designs cannot identify disused data from valid data; therefore, all valid data, including disused data, will be rewritten to flash memory during the GC process. Fortunately, a flash storage vendor recently proposed a new write command to bring extra information to flash translation layer (FTL). Thanks to the new write command, the lifetime information of data can be brought from a host-side system to an FTL management layer for disused data identification. By such observations, this work proposes a dual-time referencing FTL (DTR-FTL) design to deal with disused data and minimize the overhead of GC by referring to data lifetime information and block retention time.

原文???core.languages.en_GB???
主出版物標題2020 57th ACM/IEEE Design Automation Conference, DAC 2020
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781450367257
DOIs
出版狀態已出版 - 7月 2020
事件57th ACM/IEEE Design Automation Conference, DAC 2020 - Virtual, San Francisco, United States
持續時間: 20 7月 202024 7月 2020

出版系列

名字Proceedings - Design Automation Conference
2020-July
ISSN(列印)0738-100X

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???57th ACM/IEEE Design Automation Conference, DAC 2020
國家/地區United States
城市Virtual, San Francisco
期間20/07/2024/07/20

指紋

深入研究「How to cut out expired data with nearly zero overhead for solid-state drives」主題。共同形成了獨特的指紋。

引用此