High repair-efficiency BISR scheme for RAMs by reusing bitmap for bit redundancy

Keyphrases

• Random Access Memory 100%
• Built-in Self-repair 100%
• Repair Scheme 100%
• Repair Rate 100%
• Redundancy 100%
• Bitmap 100%
• Local Bitmap 71%
• Redundancy Analysis Algorithm 28%
• Row-column 28%
• 32-bit 14%
• Hardware Overhead 14%
• Time Penalty 14%
• Caching 14%
• Fault Distribution 14%
• 3-bits 14%
• Fault Information 14%

Computer Science

• Random Access Memory 100%
• Redundancy Analysis 40%
• Hardware Overhead 20%
• Fault Information 20%

Engineering

• Random Access Memory 100%
• Simulation Result 20%
• Hardware Overhead 20%