High reliability built-in self-detection and self-correction design for DCT/IDCT application

Chang Hsin Cheng, Chun Lung Hsu, Chung Kai Liu, Shih Yin Lin

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

This paper proposes an efficient built-in self-detection and self-correction techniques to detect and correct error in discrete cosine transform (DCT)/inverse discrete cosine transform (IDCT) based on the biresidue codes. On the other hand, any single bit error of DCT/IDCT can be efficiently detected or corrected. Experimental results show the proposed BISDC architecture has good performance in throughput with reasonable area overhead and high reliability.

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主出版物標題Proceedings - IEEE International SOC Conference, SOCC 2011
頁面213-218
頁數6
DOIs
出版狀態已出版 - 2011
事件24th IEEE International System on Chip Conference, SOCC 2011 - Taipei, Taiwan
持續時間: 26 9月 201128 9月 2011

出版系列

名字International System on Chip Conference
ISSN(列印)2164-1676
ISSN(電子)2164-1706

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???event.eventtypes.event.conference???24th IEEE International System on Chip Conference, SOCC 2011
國家/地區Taiwan
城市Taipei
期間26/09/1128/09/11

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