摘要
We present an effective approach to grow high-quality thin film of composite quantum dots (CQDs) as a building block for thermoelectric materials, in which 3 times the usual Ge deposition can be incorporated within a 3-fold CQD. Selective chemical etching experiments reveal that a thin Si inserted layer in the CQDs modifies the growth mechanism through surface-mediated diffusion and SiGe alloying. Such thin-film-like CQD materials are demonstrated to exhibit reduced thermal conductivity κ with respect to the conventional QDs, perhaps as a consequence of enhanced diffusive phonon scattering from the high Si/Ge interface density and enhanced local alloying effect.
| 原文 | ???core.languages.en_GB??? |
|---|---|
| 文章編號 | 101902 |
| 期刊 | Applied Physics Letters |
| 卷 | 102 |
| 發行號 | 10 |
| DOIs | |
| 出版狀態 | 已出版 - 11 3月 2013 |
指紋
深入研究「High quality multifold Ge/Si/Ge composite quantum dots for thermoelectric materials」主題。共同形成了獨特的指紋。引用此
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