High-precision tracking and charge selection with silicon strip detectors for relativistic ions

B. Alpat, G. Ambrosi, C. Balboni, R. Battiston, A. Biland, M. Bourquin, W. J. Burger, Y. H. Chang, A. E. Chen, N. Dinu, P. Extermann, E. Fiandrini, S. R. Hou, M. Ionica, R. Ionica, W. T. Lin, W. Lustermann, G. Maehlum, M. Menichelli, M. PauluzziN. Produit, D. Rapin, D. Ren, M. Ribordy, H. Sann, D. Schardt, K. Sümmerer, G. Viertel, D. Vité, W. Wallraff, S. X. Wu

研究成果: 雜誌貢獻期刊論文同行評審

8 引文 斯高帕斯(Scopus)

摘要

High-precision tracking and charge selection with silicon strip detectors for relativistic ions has been investigated using a 12C beam of 1.5 GeV/u at GSI with prototype modules developed for the AMS tracker. The ionization energy loss is measured and compared to the Landau-Vavilov theory for ions of charge number up to Z = 6. The linearity in Z2 is examined. The capability to distinguish different Z values based on the ionization energy loss is evaluated. The spatial resolution of the silicon strip detectors is investigated for carbon ions. The angular distribution of multiple Coulomb scattering is studied with lead absorbers. The results are compared to the Moliere theory and the Gaussian approximation of GEANT calculations.

原文???core.languages.en_GB???
頁(從 - 到)522-535
頁數14
期刊Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
446
發行號3
DOIs
出版狀態已出版 - 21 5月 2000

指紋

深入研究「High-precision tracking and charge selection with silicon strip detectors for relativistic ions」主題。共同形成了獨特的指紋。

引用此