High fidelity loud microspeaker based on PZT bimorph diaphragm

Youngki Choe, Shih Jui Chen, Eun Sok Kim

研究成果: 書貢獻/報告類型會議論文篇章同行評審

6 引文 斯高帕斯(Scopus)

摘要

This paper describes a microspeaker (composed of a 8 × 8 mm 2 square mechanically-polished PZT bimorph diaphragm and bulk-micromachined silicon top cover) that shows flat diaphragm displacement from DC to 11 kHz. The microspeaker with an encapsulating cylindrical package of about 0.7 cc inside volume produces sound pressure level (SPL) of 118 ~ 125 dB between 1 and 10 kHz when measured 5 mm away from the diaphragm with 190V pcak-to-pcak sinusoidal input. The maximum displacement at the center of the diaphragm was measured to be 7.25 μm at the fundamental resonance frequency of 14.3 kHz, and the corresponding sound pressure level (SPL) was measured to be 133 dB.

原文???core.languages.en_GB???
主出版物標題Nanotechnology 2010
主出版物子標題Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010
頁面316-319
頁數4
出版狀態已出版 - 2010
事件Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010 - Anaheim, CA, United States
持續時間: 21 6月 201024 6月 2010

出版系列

名字Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010
2

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010
國家/地區United States
城市Anaheim, CA
期間21/06/1024/06/10

指紋

深入研究「High fidelity loud microspeaker based on PZT bimorph diaphragm」主題。共同形成了獨特的指紋。

引用此